SCIENTIFIC TOOLS FOR CHARACTERIZATION OF SURFACE MORPHOLOGY OF SOLID STATE PHARMACEUTICALS
SwathimutyamPallerla, *Dr. BalaPrabhakar, Debendra Kumar Panda
ShobhabenPratapbhai Patel School of Pharmacy and Technology Management, Vile Parle, Mumbai – 400092.
ABSTRACT
The surface properties of solid state pharmaceuticals are of critical
importance. Processing modifies the surfaces and effects surface
roughness, which influences the performance of the final dosage form
at many different levels. Surface roughness has an effect on, e.g., the
properties of powders, tablet compression and tablet coating. The goal
of this review is to understand the surface structures of pharmaceutical
surfaces. In this context the specific purpose is to compare four
different analysing techniques (optical microscopy, scanning electron
microscopy (SEM), laser profilometry and atomic force microscopy
(AFM)) in various pharmaceutical applications where thesurfaces have
quite different roughness scale. It was found that optical microscopy
was still a very efficient technique, as it yielded information that SEM
and AFM imaging are not able to provide. Roughness measurements
complemented theimage data and gave quantitative information about
height differences. AFM roughness data represents the roughness of
only a small part of the surface and therefore needs other methods like laser profilometer are
needed to provide a larger scale description of the surface. The new developed roughness
analysing method visualised surface roughness by giving detailed roughness maps, which
showed local variations in surface roughness values. The method was able to provide a
picture of the surface heterogeneity and the scale of the roughness.
Keywords: Optical Microscopy, Scanning Electron Microscopy (SEM), Laser Profilometry And Atomic Force Microscopy (AFM), Terahertz Pulsed Imaging (TPI).
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