WJPPS Citation

Login

Search

News & Updation

  • Updated Version
  • WJPPS introducing updated version of OSTS (online submission and tracking system), which have dedicated control panel for both author and reviewer. Using this control panel author can submit manuscript
  • Call for Paper
    • WJPPS  Invited to submit your valuable manuscripts for Coming Issue.
  • Journal web site support Internet Explorer, Google Chrome, Mozilla Firefox, Opera, Saffari for easy download of article without any trouble.
  •  
  • New Impact Factor
  • WJPPS Impact Factor has been Increased to 8.025 for Year 2024.

  • ICV
  • WJPPS Rank with Index Copernicus Value 84.65 due to high reputation at International Level

  • Scope Indexed
  • WJPPS is indexed in Scope Database based on the recommendation of the Content Selection Committee (CSC).

  • WJPPS: JUNE ISSUE PUBLISHED
  • June Issue has been successfully launched on 1 June 2024.

Abstract

SCIENTIFIC TOOLS FOR CHARACTERIZATION OF SURFACE MORPHOLOGY OF SOLID STATE PHARMACEUTICALS

SwathimutyamPallerla, *Dr. BalaPrabhakar, Debendra Kumar Panda

ShobhabenPratapbhai Patel School of Pharmacy and Technology Management, Vile Parle, Mumbai – 400092.

ABSTRACT

The surface properties of solid state pharmaceuticals are of critical importance. Processing modifies the surfaces and effects surface roughness, which influences the performance of the final dosage form at many different levels. Surface roughness has an effect on, e.g., the properties of powders, tablet compression and tablet coating. The goal of this review is to understand the surface structures of pharmaceutical surfaces. In this context the specific purpose is to compare four different analysing techniques (optical microscopy, scanning electron microscopy (SEM), laser profilometry and atomic force microscopy (AFM)) in various pharmaceutical applications where thesurfaces have quite different roughness scale. It was found that optical microscopy was still a very efficient technique, as it yielded information that SEM and AFM imaging are not able to provide. Roughness measurements complemented theimage data and gave quantitative information about height differences. AFM roughness data represents the roughness of only a small part of the surface and therefore needs other methods like laser profilometer are needed to provide a larger scale description of the surface. The new developed roughness analysing method visualised surface roughness by giving detailed roughness maps, which showed local variations in surface roughness values. The method was able to provide a picture of the surface heterogeneity and the scale of the roughness.

Keywords: Optical Microscopy, Scanning Electron Microscopy (SEM), Laser Profilometry And Atomic Force Microscopy (AFM), Terahertz Pulsed Imaging (TPI).


[Download Article]     [Download Certifiate]

Call for Paper

World Journal of Pharmacy and Pharmaceutical Sciences (WJPPS)
Read More

Online Submission

World Journal of Pharmacy and Pharmaceutical Sciences (WJPPS)
Read More

Email & SMS Alert

World Journal of Pharmacy and Pharmaceutical Sciences (WJPPS)
Read More